ECE-4520: Digital and Mixed-Signal System Testing and Testable Design

Description: Various topics on testing and testable design for digital and mixed-signal systems are studied: fault modeling, logic and fault simulation, fault modeling, automatic test pattern generation, deterministic ATPG, simulation-based ATPG, delay fault testing, design for testability, built-in-self-test and fault diagnosis.

Pathways: N/A

Course Hours: 3 credits

Corequisites: N/A

Crosslist: N/A

Repeatability: N/A