ECE-4520: Digital and Mixed-Signal System Testing and Testable Design
Description: Various topics on testing and testable design for digital and mixed-signal systems are studied: fault modeling, logic and fault simulation, fault modeling, automatic test pattern generation, deterministic ATPG, simulation-based ATPG, delay fault testing, design for testability, built-in-self-test and fault diagnosis.
Pathways: N/A
Course Hours: 3 credits
Corequisites: N/A
Crosslist: N/A
Repeatability: N/A
Sections Taught: 8
Average GPA: 2.83 (B)
Strict A Rate (No A-) : 25.78%
Average Withdrawal Rate: 1.39%
| Michael S Hsiao | 2018 | 34.1% | 30.4% | 22.1% | 10.0% | 2.1% | 1.4% | 2.83 | 8 |